演講訊息 TALKS

摘要： A frequently used tool to identify an unknown set of defective (positive) elements out of a large collection of elements by group tests is called Group Testing. In theclassic group testing, a "group" test can be any "subset" of the given collection and its outcome is binary under Boolean operations: YES or NO. The former indicates that there is a positive element in this test and the latter implies no positive elements. In this talk, I will introduce a novel but natural generalization of Group Testing, called Multi-Group Testing. Namely, a test can be applied to any "multi-subset" of the given set, where "multi" means that every single element is allowed to be taken more than once in the same test. Obviously, allowing a number of duplicate copies in a test is meaningless under the assumption of Boolean operations. Therefore, we relax the rule of test outcomes in the Multi-Group Testing to arithmetic operations. In this talk, I will propose efficient strategies to solve this problem under some additional conditions.